Constant-stress accelerated life test of white organic light-emitting diode based on least square method under Weibull distribution
نویسندگان
چکیده
منابع مشابه
Evaluation of device reliability based on accelerated tests
Reliability evaluation based on degradation is very useful in systems with scarce failures. In this paper a new degradation model based on Weibull distribution is proposed. The model is applied to the degradation of Light Emitting Diodes (LEDs) under different accelerated tests. The results of these tests are in agreement with the proposed model and reliability function is evaluated.
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